Part of the upgrade of the KLOE detector at the DA Phi NE Phi-factory consists of the insertion of a tracking device around the interaction region, composed of four tracking layers with radii from 130mm to 205mm and an active length of 700mm. Each layer was realized as a cylindrical triple-GEM (CGEM) kapton-based detector, a solution that allows us to keep the total material budget below 2% of X-0, of utmost importance to limit the multiple scattering of low-momentum tracks at KLOE-2, and to minimize dead spaces. The peculiar readout pattern with XV strips provides a spatial resolution of about 200 mu m on both views, while a dedicated readout system has been developed by the KLOE-2 collaboration. It is composed of a digital readout front-end card based on the GASTONE ASIC and a General Interface Board with a configurable FPGA architecture and Gigabit Ethernet. The construction of the four CGEM layers has been completed and the detectors have been tested with a beta source and cosmic-ray muons. The insertion inside the KLOE apparatus was performed in July 2013. The construction procedure and the results of the validation tests will be reported.
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机译：DA Phi NE Phi工厂的KLOE检测器升级的一部分包括在交互区域周围插入跟踪设备，该跟踪设备由半径从130mm至205mm且有效长度为700mm的四个跟踪层组成。每层都实现为圆柱形三重GEM（CGEM）聚酰亚胺基探测器，该解决方案使我们能够将总材料预算保持在X-0的2％以下，这对于限制低动量轨道的多次散射至关重要在KLOE-2上，并尽量减少死角。带有XV条纹的独特读取模式在两个视图上均提供约200微米的空间分辨率，而KLOE-2合作开发了专用的读取系统。它由基于GASTONE ASIC的数字读出前端卡和具有可配置FPGA架构和千兆位以太网的通用接口板组成。四个CGEM层的构造已经完成，并且探测器已经通过β源和宇宙射线μ子进行了测试。 2013年7月在KLOE设备内部进行了插入。将报告施工过程和验证测试结果。
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